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 GT20J101
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
GT20J101
High Power Switching Applications
Unit: mm * * * * Third-generation IGBT Enhancement mode type High speed: tf = 0.30 s (max) Low saturation voltage: VCE (sat) = 2.7 V (max)
Absolute Maximum Ratings (Ta = 25C)
Characteristic Collector-emitter voltage Gate-emitter voltage Collector current Collector power dissipation (Tc = 25C) Junction temperature Storage temperature range DC 1 ms Symbol VCES VGES IC ICP PC Tj Tstg Rating 600 20 20 40 130 150 -55~150 Unit V V A
W C C
JEDEC JEITA

Note: Using continuously under heavy loads (e.g. the application of high TOSHIBA 2-16C1C temperature/current/voltage and the significant change in Weight: 4.6 g temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Marking
TOSHIBA
GT20J101
Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish.
1
2006-11-01
GT20J101
Electrical Characteristics (Ta = 25C)
Characteristic Gate leakage current Collector cut-off current Gate-emitter cut-off voltage Collector-emitter saturation voltage Input capacitance Rise time Switching time Turn-on time Fall time Turn-off time Thermal resistance Symbol IGES ICES VGE (OFF) VCE (sat) Cies tr ton tf toff Rth (j-c) Test Condition VGE = 20 V, VCE = 0 VCE = 600 V, VGE = 0 IC = 2 mA, VCE = 5 V IC = 20 A, VGE = 15 V VCE = 20 V, VGE = 0, f = 1 MHz Inductive Load VCC = 300 V, IC = 20 A VGG = 15 V, RG = 56 (Note1) Min 5.0 Typ. 2.1 1450 0.12 0.40 0.15 0.50 Max 500 1.0 8.0 2.7 Unit nA mA V V pF



0.30 s
0.96 C/W
Note1: Switching time measurement circuit and input/output waveforms
VGE GT20J301 -VGE IC RG L VCC VCE 0 IC 90% VCE 10% td (off) tf toff ton 10% 10% td (on) tr 90% 10% 0
90% 10%
Note2: Switching loss measurement waveforms
VGE 0
90% 10%
IC
0
VCE
10%
Eoff
Eon
2
2006-11-01
GT20J101
IC - VCE
50 15 13 20 Common emitter Tc = 25C 40 20 Common emitter
VCE - VGE
VCE (V)
Tc = -40C 16
Collector current IC
(A)
Collector-emitter voltage
30
12
12
20
8 10 4 IC = 5 A 20 40
10
VGE = 10 V
0
0
1
2
3
4
5
0 0
4
8
12
16
20
Collector-emitter voltage
VCE (V)
Gate-emitter voltage
VGE (V)
VCE - VGE
20 Common emitter 20 Common emitter
VCE - VGE
VCE (V)
16
VCE (V)
Tc = 25C
Tc = 125C 16
Collector-emitter voltage
Collector-emitter voltage
12
12
8 10 20 4 IC = 5 A 40
8 20 10 4 IC = 5 A 40
0
0
4
8
12
16
20
0 0
4
8
12
16
20
Gate-emitter voltage
VGE (V)
Gate-emitter voltage
VGE (V)
IC - VGE
50 Common emitter 4 Common emitter
VCE (sat) - Tc
Collector-emitter saturation voltage VCE (sat) (V)
VCE = 5 V
(A)
40
VGE = 15 V 3 40 30 2 20 10 1 IC = 5 A
Collector current IC
30
20 25 10 Tc = 125C 0 0 -40
4
8
12
16
20
0 -60
-20
20
60
100
140
Gate-emitter voltage
VGE (V)
Case temperature Tc (C)
3
2006-11-01
GT20J101
Switching time
3 Common emitter VCC = 300 V VGG = 15 V IC = 20 A : Tc = 25C : Tc = 125C
ton, tr - RG
3 ton
Switching time
Common emitter VCC = 300 V VGG = 15 V RG = 56 : Tc = 25C : Tc = 125C ton 0.1 0.05 0.03 tr 0.01
ton, tr - IC
(s)
1 0.5 0.3
(s) Switching time ton, tr
tr
1 0.5 0.3
Switching time ton, tr
0.1 0.05 0.03 3
10
30
100
300
1000
0
4
8
12
16
20
Gate resistance
RG
()
Collector current IC
(A)
Switching time
3 Common emitter VCC = 300 V VGG = 15 V IC = 20 A : Tc = 25C : Tc = 125C
toff, tf - RG
3
Switching time
toff, tf - IC
Switching time toff, tf (s)
1 0.5 0.3
Switching time toff, tf (s)
1 0.5 0.3
toff
toff
tf
0.1 0.05 0.03
tf Common emitter VCC = 300 V VGG = 15 V RG = 56 : Tc = 25C : Tc = 125C 4 8 12 16 20
0.1 0.05
0.03 3
10
30
100
300
1000
0.01 0
Gate resistance
RG
()
Collector current IC
(A)
Switching loss
10 Common emitter VCC = 300 V VGG = 15 V IC = 20 A : Tc = 25C : Tc = 125C Note2
Eon, Eoff - RG
10
Switching loss
Common emitter VCC = 300 V VGG = 15 V RG = 56 : Tc = 25C : Tc = 125C Note2
Eon, Eoff - IC
Eon, Eoff (mJ)
Eon, Eoff (mJ)
3
3 1
Eon
Eon
1
Eoff
0.3
Switching loss
Switching loss
Eoff
0.1
0.3
0.03
0.1 1
10
100
1000
0.01
0
4
8
12
16
20
Gate resistance
RG
()
Collector current IC
(A)
4
2006-11-01
GT20J101
C - VCE
5000 3000 500
VCE, VGE - QG
20 Common emitter RL = 15 Tc = 25C
VCE (V)
1000
Cies
400
16
Collector-emitter voltage
300 100
Capacitance C
200
VCE = 100 V
200
8
30 Common emitter 10 VGE = 0 f = 1 MHz 5 0.5 Tc = 25C 1 3 10 30 100 300
Coes
100
4
Cres 1000 3000
0 0
20
40
60
80
0 100
Collector-emitter voltage
VCE (V)
Gate charge QG (nC)
Safe operating area
100 50 30 IC max (pulsed)* 100 10 ms* 100 s* 50 s* 50 30
Reverse bias SOA
(A)
Collector current IC
1 ms* DC operation
5 3
Collector current IC
IC max 10 (continuous)
(A)
10 5 3
1 0.5 *: Single nonrepetitive pulse Tc = 25C 0.3 Curves must be derated linearly with increase in temperature. 0.1 1 3 10 30
1 0.5 0.3 Tj < 125C = VGE = 15 V RG = 56 1 3 10 30 100 300 1000 3000
0.1 100 300 1000 3000
Collector-emitter voltage
VCE (V)
Collector-emitter voltage
VCE (V)
Rth (t) - tw
10 2
Transient thermal impedance Rth (t) (C/W)
10
1
10
0
10
-1 -2 -3 Tc = 25C -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 2
10
10
10
-4 10
Pulse width
tw
(s)
5
2006-11-01
Gate-emitter voltage
300
300
12
VGE (V)
(pF)
GT20J101
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
6
2006-11-01


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